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How to Simulate
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Simulating Test in Testbag is very Easy
All Test are classified Main Category wise. Each
main category represents a group of exams.
For example
Medical Entrance Exams
Engineering Entrance Exams
UPSC Exams
Hotel Management Exams and so on
Each Main Category will be further classified into categories.
Each category represents Institute / Board conducting
the exam or Exam types . For example
|
| Main Category |
Category |
| Medical Entrance Exams |
All India Institute of Medical Science Ent. Exam
Armed Force Medical College entrance Exam
Banaras Hindu University Entrance Exam and so on
|
| Engineering Entrance Exam |
Central Board of Secondary Education Exams
Andhra Pradesh State Council of Higher Education
Birla Institute of Technology and so on
|
| UPSC Exams |
Civil Services (Preliminary) Examinations
Airports Authority�of India Exams
and so on
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category is further classified into subcategories. Each
subcategory represent specific exam within the category.
For example |
| Category |
Subcategory |
| Central Board of Secondary Education
Exams |
All India Engineering/Architecture
Examination
|
| Civil Services (Preliminary) Examinations |
Civil Services (Preliminary) Examinations
General Studies
Civil Services (Preliminary) Examinations Botany
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Each
subcategory is further classified into Model Test Category.
Each Test
Category represents subject wise model tests. For example
|
| Subcategory |
Model Test Category |
| All India Engineering/Architecture
Examination |
AIEEE Physics Model Tests
AIEEE Chemistry Model Tests
AIEEE Maths Model Tests
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Each
Test Category is further classified into Model Test
Patterns. Each
Test Pattern is classified either year wise or number
wise. The year represents the
Memory based model test pattern for exam in said year
. If model test pattern is number
wise it represents a pattern created by experts keeping
previous years patterns in view.
For example
|
| Model Test Category |
Model Test Pattern |
| AIEEE Physics Tests |
AIEEE 2007
AIEEE 1
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In
this case AIEEE PHYSICS 2007 represents memory based model
test pattern for
AIEEE PHYSICS exam in year 2007 and AIEEE 2007 1 represents
Test pattern
created by experts
Each Test Pattern is detailed as per pattern of
said exam to the level
Number of questions in exam
Number of questions per page
Total time for test
Marks for correct answer
Marks for incorrect answer
Marks for questions not attempted
Topics/subtopics from where the question were included
in the said exam
Number of questions each topic wise
Difficulty level each topic wise/subtopic wise
Question types whether multiple choice, multiple response,
fill in blanks, true false
For example in Test Pattern AIEEE PHYSICS 2007 details
are as under
|
| Number of questions in exam |
40 |
| Number of questions per page |
20 |
| Total time for test (in minutes) |
60 |
| Marks for correct answer |
3.0 |
| Marks for incorrect answers |
-1.0 |
| Marks for questions not attempted |
Nil |
|
| Topics (Chapter wise) |
Number of Question
|
Level of Difficulty
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Question types
|
| Motion in One Dimension |
1 |
medium |
multiple choice |
| Motion in two Dimension |
1 |
medium |
multiple choice |
| Laws of Motion |
1 |
medium |
multiple choice |
| Work, Energy and Power |
1 |
medium |
multiple choice |
| Rotational Motion and Dynamics |
4 |
medium |
multiple choice |
| Heat |
2 |
medium |
multiple choice |
| Thermodynamics |
2 |
medium |
multiple choice |
| Oscillations |
4 |
medium |
multiple choice |
| Waves |
1 |
medium |
multiple choice |
| Electrostatics |
5 |
medium |
multiple choice |
| Current Electricity |
2 |
medium |
multiple choice |
| Magnetic Effects of Current |
5 |
medium |
multiple choice |
| Electromagnetic Induction |
1 |
medium |
multiple choice |
| Alternating current |
1 |
medium |
multiple choice |
| Ray Optics |
1 |
medium |
multiple choice |
| Wave Optics |
1 |
medium |
multiple choice |
| Atom Nuclei and Molecules |
3 |
medium |
multiple choice |
| Dual Nature of Radiation |
2 |
medium |
multiple choice |
| Solids and semiconductors |
2 |
medium |
multiple choice |
| TOTAL QUESTIONS |
40 |
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Every
time on starting test, a new test on the said pattern
with different sets of
questions but on same topics will be available for users
to practice. The test will
have specific time and marks as defined in the pattern
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